k Atomic force microscopy, conceptual SEM Atomic force microscopy. Coloured scanning electron micrograph SEM of a polymer bead attached to a siliconnitride cantilever and tip, as used in atomic force microscopy AFM. An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load. Stock Photo - Afloimages
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Atomic force microscopy, conceptual SEM Atomic force microscopy. Coloured scanning electron micrograph SEM of a polymer bead attached to a silicon nitride cantilever and tip, as used in atomic force microscopy AFM . An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.
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Atomic force microscopy, conceptual SEM

Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a polymer bead attached to a silicon-nitride cantilever and tip, as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.

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