k Atomic force microscopy, SEM Atomic force microscopy. Coloured scanning electron micrograph SEM of a cantilever and tip triangle, as used in atomic force microscopy AFM. An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.Magnification x6600 when printed at 10 centimetres wide. Stock Photo - Afloimages
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Atomic force microscopy, SEM Atomic force microscopy. Coloured scanning electron micrograph SEM of a cantilever and tip triangle , as used in atomic force microscopy AFM . An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.Magnification: x6600 when printed at 10 centimetres wide.
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Atomic force microscopy, SEM

Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.Magnification: x6600 when printed at 10 centimetres wide.

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