RM
Atomic force microscope
Atomic force microscope (AFM). AFMs are used to study the surfaces of objects at an atomic level. An extremely fine spring-mounted probe, that is either held in contact with the surface or just above it, slowly moves across the surface. Any deflections are recorded and converted into a computer map of the surface. This microscope is a metrological AFM (MAFM), used to calibrate other AFMs. Laser interferometers are used to measure the position of the tip relative to the sample surface. Photographed at the National Physical Laboratory, Teddington, UK.
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