RM
Scanning probe microscopy sample holder
Scanning probe microscopy (SPM) sample holder. This is the SPM MultiProbe S from Omicron Nano Technology. Samples are prepared and clean under vacuum, with metal deposited on the surface to allow the scanning process to take place. Techniques that can be used with this device include atomic force microscopy (contact, non-contact, tapping modes), scanning tunnelling microscopy, and scanning Kelvin probe microscopy, all using ultra-high vacuums. Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL), Golden, Colorado, USA.
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