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Silicon atom in graphene, STEM
Silicon atom in graphene. Coloured scanning transmission electron micrograph (STEM) showing an individual silicon atom found as an impurity in the material graphene, an isomer of carbon. This image was obtained using aberration-corrected scanning transmission electron microscopy to study the atomic and electronic structure of silicon impurities in graphene. This is part of research into the uses of graphene, carried out at the US Department of Energy's Oak Ridge National Laboratory. The results were published in 2012.
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