k Atomic force microscope suspension system, abstract image Atomic force microscope suspension system, abstract image. Atomic force microscopy AFM, also called scanning force microscopy SFM, uses an atomicsized tip to probe the surface of a material. This allows a threedimensional map of the surface to be constructed, down to the scale of individual atoms. Stock Photo - Afloimages
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Atomic force microscope suspension system, abstract image Atomic force microscope suspension system, abstract image. Atomic force microscopy AFM , also called scanning force microscopy SFM , uses an atomic sized tip to probe the surface of a material. This allows a three dimensional map of the surface to be constructed, down to the scale of individual atoms.
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Atomic force microscope suspension system, abstract image

Atomic force microscope suspension system, abstract image. Atomic force microscopy (AFM), also called scanning force microscopy (SFM), uses an atomic-sized tip to probe the surface of a material. This allows a three-dimensional map of the surface to be constructed, down to the scale of individual atoms.

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